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    Title :

    Effect of the OH ions on SiO~2/SPG/SiO~2/InSb device stability [2274-30]


    Contributors:

    Conference:

    Conference, Infrared detectors: state of the art II ; 1994 ; San Diego; CA



    Publication date :

    1994-01-01


    Size :

    7 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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