Surface profile determination by additive-subtractive phase-modulated ESPI with Fourier analysis [2860-19]
Conference; 8th, Laser interferometry VIII: techniques and analysis ; 1996 ; Denver; CO
1996-01-01
13 pages
See also same shelfmark vol 2861 1996 for further papers
Conference paper
English
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British Library Conference Proceedings | 1996
|DataCite | 1900
Fourier transform technique for phase unwrapping with minimized boundary effects [2860-06]
British Library Conference Proceedings | 1996
|Achromatic phase shifting for polarization interferometry [2860-11]
British Library Conference Proceedings | 1996
|Nonoptical surface measurement by oblique incidence interferometry [2860-34]
British Library Conference Proceedings | 1996
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