Integration of Simulation and Testing for Microelectronics Package Reliability Improvement
Session, Electronic packaging ; 1998 ; Detroit; MI
1998-01-01
16 pages
Held as part of the SAE international congress and exposition
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Integration of simulation and testing for microelectronics package reliability improvement
Automotive engineering | 1998
|Integration of Simulation and Testing for Microelectronics Package Reliability Improvement
SAE Technical Papers | 1998
|NTIS | 2017
|Microelectronics and space vehicle reliability.
NTRS | 1966
|Reliability considerations for advanced microelectronics
NTRS | 2001
|