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    Title :

    Critical Configurations for N-View Projective Reconstruction


    Contributors:
    Kahl, F. (author) / Hartley, R. (author) / Astrom, K. (author) / IEEE

    Conference:

    Conference; 20th, Computer vision and pattern recognition ; 2001 ; Kauai, HI



    Publication date :

    2001-01-01


    Size :

    II-158-II-163


    Remarks:

    IEEE cat no PR01272; One CD-ROM in pocket attached to inside back cover of vol 1




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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