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    Title :

    Applications of x-ray intensity interferometry [4782-16]



    Conference:

    conference, X-ray mirrors crystals and multilayers ; 2002 ; Seattle, WA



    Publication date :

    2002-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4782

    DataCite | 1937


    High-resolution carbon/carbon multilayers [4782-22]

    Baranov, A. M. / Dietsch, R. / Holz, T. et al. | British Library Conference Proceedings | 2002


    Highly reflective uranium mirrors for astrophysics applications [4782-29]

    Allred, D. D. / Squires, M. B. / Turley, R. S. et al. | British Library Conference Proceedings | 2002


    Development of EUV point diffraction interferometry using the NewSUBARU undulator radiation [4782-27]

    Niibe, M. / Mukai, M. / Tanaka, T. et al. | British Library Conference Proceedings | 2002


    Temperature-dependence perturbations on LTP measurements [4782-04]

    Sostero, G. / Bianco, A. / Zangrando, M. et al. | British Library Conference Proceedings | 2002