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    Title :

    Micro-arcsecond metrology (MAM) testbed overview [4852-04]


    Contributors:
    Hines, B. E. (author) / Bell, C. E. (author) / Goullioud, R. (author) / Spero, R. (author) / Neat, G. W. (author) / Shen, T. J. (author) / Bloemhof, E. E. (author) / Shao, M. (author) / Catanzarite, J. (author) / Regehr, M. W. (author)

    Conference:

    Conference, Interferometry in space ; 2002 ; Waikoloa, HI



    Publication date :

    2003-01-01


    Size :

    12 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    The Micro-arcsecond Metrology Testbed (MAM)

    Schmidtlin, E. / Savedra, R. / Lin, Y. et al. | NTRS | 1998



    Absolute metrology for the Kite testbed [4852-54]

    Mason, J. E. / SPIE | British Library Conference Proceedings | 2003


    Wide-field imaging interferometry testbed 3: metrology subsystem [4852-99]

    Leviton, D. B. / Frey, B. J. / Leisawitz, D. T. et al. | British Library Conference Proceedings | 2003


    Testbed for a fiber-optic-based laser metrology gauge [4852-62]

    Tuttle, C. E. / Bell, R. M. / Anderson, W. W. et al. | British Library Conference Proceedings | 2003