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    Title :

    Evaluation of Data Retention and Imprint Characteristics of FRAMs Under Environmental Stresses for NASA Applications



    Conference:

    3rd, Non-volatile memory technology symposium ; 2002 ; Honolulu, HI



    Publication date :

    2002-01-01


    Size :

    8 pages


    Remarks:

    Also known as NVMTS2002


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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