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    Title :

    Warpage measurement system with systematic error analysis [5058-85]



    Conference:

    Conference, Optical technology and image processing for fluids and solids diagnostics ; 2002 ; Beijing



    Publication date :

    2003-01-01


    Size :

    6 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 5058

    DataCite | 1942


    Error analysis of stereoscopic particle image velocimetry [5058-14]

    Zhang, M. / Shen, G. X. / Wei, R. et al. | British Library Conference Proceedings | 2003


    Measurement of shear-stress distribution by liquid crystal coating [5058-55]

    Fujisawa, N. / Funatani, S. / Kosaka, S. et al. | British Library Conference Proceedings | 2003


    Micro-deformation measurement using focused ion-beam moire method [5058-51]

    Xie, H. / Li, B. / Geer, R. E. et al. | British Library Conference Proceedings | 2003


    3D movement and attitude measurement of objects with image sequence analysis [5058-90]

    Ding, X. / Yu, Q. / Cao, Y. et al. | British Library Conference Proceedings | 2003