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    Title :

    Degradation Mode Analysis on Highly Reliable Guardring-Free Planar InAlAs Avalanche Photodiodes


    Contributors:
    Ishimura, E. (author) / Yagyu, E. (author) / Nakaji, M. (author) / Ihara, S. (author) / Yoshiara, K. (author) / Aoyagi, T. (author) / Tokuda, Y. (author) / Ishikawa, T. (author)

    Published in:

    JOURNAL OF LIGHTWAVE TECHNOLOGY ; 25 , 12 ; 3686-3693


    Publication date :

    2007-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



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