Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Characterization of polycrystalline Ge thin films fabricated by short-pulse XeF excimer laser crystallization


    Contributors:
    Kuo, C. C. (author)


    Publication date :

    2008-01-01


    Size :

    9 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3827





    Laser short-pulse heating of silicon-aluminum thin films

    Mansoor, S. B. / Yilbas, B. S. | British Library Online Contents | 2011



    Crystallization of 500-nm-thick a-SiGe:H films through ArF-excimer laser radiation [5147-24]

    Chiussi, S. / Fabbri, F. / Fornarini, L. et al. | British Library Conference Proceedings | 2003