Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Failure Characteristics and Mechanism Analysis of IGBT Modules under High-Temperature Power Cycling


    Contributors:
    Chen, M. (author)

    Published in:

    Publication date :

    2014-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    500



    Fast power cycling test of IGBT modules in traction application

    Held, M. / Jacob, P. / Nicoletti, G. et al. | Tema Archive | 1997


    Model for Power Cycling lifetime of IGBT Modules - various factors influencing lifetime

    Bayerer, R. / Licht, T. / Herrmann, T. et al. | British Library Conference Proceedings | 2008


    Performance and Characteristics of 1700V Low Loss IGBT in High Power Modules

    Schilling, O. / Auerbach, F. / Verband Deutscher Elektrotechniker; Energietechnische Gesellschaft; Fachbereich 5 Leistungselektronik in Zusammenarbeit mit EUREL et al. | British Library Conference Proceedings | 1998


    Base Plate Shape Optimisation for High-Power IGBT Modules

    Sommer, J.-P. / Michel, B. / Bayerer, R. et al. | British Library Conference Proceedings | 2008