Interferometric metrology : 20-21 August 1987, San Diego, California
International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering ; 31st International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering ; 31st (San Diego, Calif.)
1988
vi, 239 p
28 cm
ill
Conference 816, Interferometric metrology, was part of a four-conference program on Precision Instrument Design held at SPIE's 31st annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering"--P. v
Includes bibliographies
Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek
Conference Proceedings
English
DDC: | 621.36/75 |
Digital Control of Interferometric Metrology Lines
British Library Online Contents | 2007
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