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    Title :

    Machine vision applications in industrial inspection VII : 25 - 26 January 1999, San Jose, California



    Conference:

    SPIE Conference on Machine Vision Applications in Industrial Inspection ; 7 ; 1999 ; San Jose, Calif. SPIE Conference on Machine Vision Applications in Industrial Inspection ; 7 (San Jose, Calif.) : 1999.01.25-26



    Publication date :

    1999


    Size :

    IX, 262 S


    Remarks:

    Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek



    Type of media :

    Conference Proceedings


    Type of material :

    Print


    Language :

    English



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