Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis
1966
6 S
Ill., graph. Darst
Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek
Book
English
Automatic stitching of micrographs using local features
IEEE | 2010
|Electron Optical Metallographic Instruments
NTIS | 1970
|Incremental learning to segment micrographs
British Library Online Contents | 2015
|Incremental learning to segment micrographs
British Library Online Contents | 2015
|