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    Title :

    Feinste Strukturen - Focused ion beam ( FIB ): Anwendungen fuer Untersuchungsaufgaben in der Galvanotechnik


    Additional title:

    Finest strutures - focused ion beam ( FIB ): applications for investigations in galvanization.


    Contributors:

    Published in:

    Met.-Oberflaeche ; 61 , 3 ; 30-32


    Publication date :

    2007


    Size :

    3 pages


    Remarks:

    Met.-Oberflaeche;61(2007)3 ;30-32


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    German



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