The invention relates to a semiconductor device, an electronic machine and a vehicle. And the output leakage current characteristic is improved. A semiconductor device according to the present disclosure includes a semiconductor substrate, a well formed in the semiconductor substrate, an output terminal electrically connected to the semiconductor substrate, a ground terminal to which a ground voltage is applied, and a detection signal generation circuit that generates a negative current detection signal when detecting that an output voltage of the output terminal is lower than the ground voltage. And a control circuit that applies a ground voltage or an output voltage to the well in accordance with the negative current detection signal. The detection signal generation circuit includes a comparator that compares an output detection voltage (Vs) and a ground voltage to generate a negative current detection signal, a bias circuit that applies an output voltage or a bias voltage as the output detection voltage (Vs), and a clamp circuit (CLP) that operates when Vs > VCLP.
本披露涉及一种半导体装置、电子机器、车辆。改善输出泄漏电流特性。本披露的半导体装置具备半导体衬底、形成于半导体衬底的阱、与半导体衬底导通的输出端子、被施加接地电压的接地端子、检测输出端子的输出电压低于接地电压的情况而产生负电流检测信号的检测信号产生电路、及根据负电流检测信号对阱施加接地电压或输出电压的控制电路。检测信号产生电路具备比较输出检测电压(Vs)与接地电压而产生负电流检测信号的比较器、施加输出电压或偏压电压作为输出检测电压(Vs)的偏压电路、及在|Vs|>VCLP时进行动作的箝位电路(CLP)。
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND VEHICLE
半导体装置、电子机器、车辆
2025-03-21
Patent
Electronic Resource
Chinese
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