To meet the requirements of both high reliability and low power in low-orbit aerospace applications, this article first presents a single-event Double-Upset (SEDU) self-Recoverable and single-event Transient (SET) Pulse Filterable (DURTPF) latch design with low power. The DURTPF latch mainly consists of eight mutually feeding-back C-elements (CEs) and an SET pulse filterable Schmitt-trigger (ST). To make an ST behave not only as a pulse filterable ST but also as an error interceptive CE, an input-split ST is created, leading to an enhanced-version of the DURTPF latch, namely DURTPF-EV. The DURTPF-EV latch mainly consists of seven mutually feeding-back CEs including an input-split ST. Simulation results demonstrate both the SEDU self-recoverability and SET pulse filterability of the proposed latches at the cost of moderate silicon area. Using the clock gating technology, the DURTPF latch reduces power dissipation by about 63% on average compared with the state-of-the-art SEDU self-recoverable latch designs that are not SET-pulse filterable. Moreover, the DURTPF-EV latch is more cost-effective and its reliability is also enhanced, making it more suitable for low power and low-orbit aerospace applications.


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    Title :

    Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications


    Contributors:
    Yan, Aibin (author) / Chen, Yan (author) / Xu, Zhelong (author) / Chen, Zhili (author) / Cui, Jie (author) / Huang, Zhengfeng (author) / Girard, Patrick (author) / Wen, Xiaoqing (author)


    Publication date :

    2020-10-01


    Size :

    3236083 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English






    Orbit Control for Low-Orbit Recoverable Satellite

    Yan, G. / Feng, X. / International Federation of Automatic Control et al. | British Library Conference Proceedings | 1997