Testing analog circuits is a challenging endeavor. The subject paper investigates the Oscillation-based Built-In Self-Test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Built-In Hardware for Analog Circuitry Testing


    Contributors:


    Publication date :

    2008-09-01


    Size :

    992831 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Biomorphic Analog Neural Circuitry

    Thomas, T. | NTRS | 2000


    Biomorphic Analog Neural Circuitry

    Thomas, T. | NTRS | 2000




    ESA-Built Hardware: MCS & Biolab

    Brinckman, E. / European Space Agency | British Library Conference Proceedings | 1999