Testing analog circuits is a challenging endeavor. The subject paper investigates the Oscillation-based Built-In Self-Test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.
Built-In Hardware for Analog Circuitry Testing
2008-09-01
992831 byte
Conference paper
Electronic Resource
English
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