The problem and the challenge of the physical (mechanical) design for reliability of solder joint interconnections (SJIs) for aerospace electronics is addressed and some practically useful solutions to this problem are suggested and discussed in detail. The considered problem includes: 1) the possibility of avoiding inelastic strains in the solder material; 2) quantification, on the probabilistic basis, the expected lifetime of the SJI of interest; and 3) possible replacement of the temperature cycling accelerated testing with a more physically meaningful, less costly and less time- and labor consuming low-temperature/random-vibration bias. The general concepts are illustrated by numerical examples.
Physical Design for Reliability of Solder Joint Interconnections for Application in Aerospace Electronics
2019-06-01
2944700 byte
Conference paper
Electronic Resource
English
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