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    Title :

    Next generation testing tecrnique for embedded software: abstract semantics analysis


    Contributors:
    Hote, C. (author)


    Publication date :

    2004-01-01


    Size :

    471530 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




    Next Generation Testing Technique for Embedded Software: Abstract Semantics Analysis

    Hote, C. / IEEE / AIAA | British Library Conference Proceedings | 2004



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