In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<>


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    Title :

    Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis


    Contributors:
    Deb, S. (author) / Pattipati, K.R. (author) / Raghavan, V. (author) / Shakeri, M. (author) / Shrestha, R. (author)


    Publication date :

    1995-05-01


    Size :

    1253640 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English



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