In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<>
Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis
IEEE Aerospace and Electronic Systems Magazine ; 10 , 5 ; 14-25
1995-05-01
1253640 byte
Article (Journal)
Electronic Resource
English
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