Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.
BIT optimization design of airborne electronic equipment based on reliability
2008-12-01
557776 byte
Conference paper
Electronic Resource
English
Reliability life cycle of a complex electronic airborne equipment
Tema Archive | 1975
|Cold Plate Design for Airborne Electronic Equipment
IEEE | 1958
|Airborne Electronic Equipment Guarantees
SAE | 1970
|Airborne Electronic Equipment Lifetime Guarantee
NTIS | 1969
|Investigation of Reliability Verification for Civil Aircraft Airborne Equipment
VDE-Verlag | 2022
|