Presents a novel approach to automated visual inspection based on comparing volumetric models of a reference object to a model of an actual object iteratively created from sensor data. The use of volumetric models gives this approach a number of distinct advantages over more traditional surface-based methods. First, there is no need to identify "features" which is important when inspecting objects whose features are difficult to identify. Second, volumetric inspection lends itself naturally to multi-sensor applications. Finally, true 3-D comparisons of the reference and sensed objects can be easily carried out using volumetric models.<>


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    Title :

    IVIS: an integrated volumetric inspection system


    Contributors:


    Publication date :

    1994-01-01


    Size :

    909796 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    IVIS: An Integrated Volumetric Inspection System

    Tarbox, G. H. / Gottschlich, S. N. / IEEE Computer Society; Technical Committee on Pattern Analysis and Machine Intelligence | British Library Conference Proceedings | 1994


    IVIS: An Integrated Volumetric Inspection System

    Tarbox, G. H. / Gottschlich, S. N. | British Library Online Contents | 1995



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