Summary form only given. The characterization of >100 GHz devices were demonstrated using the photoconductive pump and probe measurement without accompanying deembedding process. The devices include transmission line, open/short termination and filters. The close agreement of the measurement to the FDTD simulation verifies the reliability and the usefulness of the measurement at the millimeter wave region over 100 GHz.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Characterization of >100 GHz devices using photoconductive pump and probe measurement


    Contributors:
    Jaehoon Lee (author) / Heeseok Lee (author) / Woopoung Kim (author) / Jongjoo Lee (author) / Joungho Kim (author)


    Publication date :

    1998-01-01


    Size :

    175962 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Characterization of >100 GHz Devices Using Photoconductive Pump and Probe Measurement

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1998


    Picosecond Photoconductive Probe

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1996


    Picosecond photoconductive probe

    Williamson, S.L. / Al-Hemyari, K. / Cheng, H.-J. et al. | IEEE | 1996


    Ultrahigh-sensitivity, Ultafast-response Photoconductive Probe

    Lai, R. K. / Hwang, J.-R. / Nees, J. et al. | British Library Conference Proceedings | 1997