We report on modeling of intensity fluctuations in semiconductor lasers subject to low and high speed digital modulation. We examine influence of deciding both decision and sampling times on bit-error-rate (BER). Correlation between BER and relative intensity noise (RIN) is presented.


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    Title :

    Dynamic Characterization of Intensity Fluctuations in Semiconductor Lasers under Digital Modulation


    Contributors:
    Ahmed, M. (author) / Yamada, M. (author)


    Publication date :

    2005-01-01


    Size :

    1050505 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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