Recently, a new class of diffractive optical element called a photon sieve, which consists of a great number of pinholes whose positions and radii are properly chosen, was developed for the focusing and imaging of soft X-rays. In the initial work, the concept of Fresnel zone and the numerical calculation of Fresnel-Kirchhoff diffraction integral was used for the analysis and design. More recently, we developed the paraxially individual far-field model for the focusing analysis of low-numerical-aperture (low-NA) photon sieves. Here, we extend this model to the nonparaxial case of high-NA photon sieves working in the soft X-ray region, for which the paraxial Fresnel diffraction formula is invalid.


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    Title :

    Nonparaxial analysis of high-numerical-aperture photon sieves


    Contributors:
    Cao, Q. (author) / Jahns, J. (author)


    Publication date :

    2003-01-01


    Size :

    83465 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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