A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.


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    Title :

    A new technique for permittivity and permeability measurements at millimeter waves


    Contributors:
    Apletalin, V. (author) / Kazantsev, Yu. (author) / Solosin, V. (author) / Zubov, A. (author)


    Publication date :

    2004-01-01


    Size :

    113939 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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