We describe the picosecond time-resolved measurement of the X-ray absorption fine structure in laser-melted Si by using a femtosecond laser-produced-plasma soft X-ray source and report that the Si-Si atomic distance broadened due to the melting.
Time-resolved X-ray absorption fine structure measurement of laser-melted Si with femtosecond laser-produced-plasma X-ray source
2005 Quantum Electronics and Laser Science Conference ; 2 ; 751-753 Vol. 2
2005-01-01
2217609 byte
Conference paper
Electronic Resource
English
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