We describe the picosecond time-resolved measurement of the X-ray absorption fine structure in laser-melted Si by using a femtosecond laser-produced-plasma soft X-ray source and report that the Si-Si atomic distance broadened due to the melting.


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    Title :

    Time-resolved X-ray absorption fine structure measurement of laser-melted Si with femtosecond laser-produced-plasma X-ray source


    Contributors:
    Oguri, K. (author) / Okano, Y. (author) / Nishikawa, T. (author) / Nakano, H. (author)


    Publication date :

    2005-01-01


    Size :

    2217609 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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