In order to measure the anisotropic optical constants of thin films accurately, the sensitivity of attenuated total reflection curve is analyzed. According to the analysis, two curve fitting procedures are developed to determine two principal indices of refraction and principal axes orientation.


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    Title :

    Optical constants determination of an anisotropic thin film by attenuated total reflection method analyzed by sensitivity calculation


    Contributors:


    Publication date :

    2003-01-01


    Size :

    23077 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English