In order to eliminate the focus deformation and at the same time localize the field near the interface, a tightly focused evanescent field combining with a radially polarized illumination, generated by interference method with a single LCD, is proposed in this paper. A scanning near-field optical microscope (SNOM) has been employed to observe the focal spot near the interface by means of directly scanning over the focal field.


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    Title :

    Focused evanescent field under radially polarized beam illumination


    Contributors:
    Baohua Jia, (author) / Xiaosong Gan, (author) / Min Gu, (author)


    Publication date :

    2005-01-01


    Size :

    171737 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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