A bench-top polarimeter (λ = 1064 nm) is used to measure the polarimetric bidirectional reflectance distribution function of several common spacecraft materials in both bistatic and monostatic geometries. The Mueller matrix and polarimetric properties of each material were estimated as a function of the illumination and viewing angles. The findings expand upon previous research suggesting that active polarimetry may be useful for the remote characterization and identification of space debris.
Active Polarimetric Measurements for Identification and Characterization of Space Debris
IEEE Transactions on Aerospace and Electronic Systems ; 53 , 6 ; 2706-2717
2017-12-01
1085280 byte
Article (Journal)
Electronic Resource
English
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