A procedure is presented for the design of a pair of sensitivity discriminating Luenberger observers for instrument failure detection (IFD). The proposed IFD scheme permits detection of instrument malfunctions with reduced sensitivity to process parameter variations. The efficiency of detecting instrument malfunctions and the influence of parameter variations are illustrated with an example.
Sensitivity Discriminating Observer Design for Instrument Failure Detection
IEEE Transactions on Aerospace and Electronic Systems ; AES-16 , 4 ; 460-467
1980-07-01
1597272 byte
Article (Journal)
Electronic Resource
English
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