We imaged the near-field intensity distribution of vertical-cavity surface-emitting lasers (VCSELs) to determine the spatial and spectral distribution of the modes. These mode distributions were used to calculate the refractive index distribution of broad-area VCSELs.
Determination of the refractive index profile in VCSELs by spatial-spectral mode imaging
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 2 ; 1375-1377 Vol. 2
2005-01-01
769093 byte
Conference paper
Electronic Resource
English
Determination of the Refractive Index Profile in VCSELs by Spatial-Spectral Mode Imaging
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