We report the first use of focused ion beam milling to fabricate surface relief gratings in optical waveguides. We demonstrate efficient coupling to very high order modes in silicon-on-insulator waveguides and discuss the implications both for future devices based on higher order modes as well as more conventional devices based on Bragg reflection from the fundamental mode.


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    Title :

    High order mode conversion via focused ion beam milled Bragg gratings in Silicon-on-Insulator Waveguides


    Contributors:
    Moss, D.J. (author) / Ta'eed, V. (author) / Eggleton, B.J. (author) / Freeman, D. (author) / Samoc, M. (author) / Madden, S. (author) / Luther-Davies, B. (author) / Janz, S. (author) / Xu, D.-X. (author)


    Publication date :

    2004-01-01


    Size :

    117978 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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