Highly accelerated life testing (HALT) is one of the most popular step-stress testing methodologies for identifying the weaknesses and increasing product reliability in a fast and cost-efficient way. The traction inverter plays a critical role in EV/HEV power train systems, and the requirements on its reliability at the harsh environment operation are becoming more demanding. In this article, to evaluate the weak links and various components performance and ascertain the effect of high temperature on the traction inverter, the traction inverter HALT was carried out with high-temperature stress between 190 °C–220 °C taking the IGBT on-die temperature as the benchmark. Nine traction inverters were tested, which were divided into four groups with respect to the designed step-stress test profile. The changes in electrical and thermal indicators were observed online using the proposed monitoring system. At the end of each test, the effects of different conditions on the overall testing time, failure modes, and damage were examined, and the damages were listed systematically and discussed. Furthermore, the characteristics of the dc-link capacitor at different temperatures and the related degradation were observed online. The results show that the inverter can operate hundreds of hours with the IGBT on-die temperature of 200 °C, and the gate driver board chip of 127 °C. The findings in this study could help to the improvement design of the traction inverter, as well as to keep the design life prediction never be overestimated.


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    Title :

    Traction Inverter Highly Accelerated Life Testing With High-Temperature Stress


    Contributors:
    Wu, Qunfang (author) / Wang, Mengqi (author) / Zhou, Weiyang (author) / Lu, Xi (author) / Xiao, Kewei (author) / Bhat, Krishna Prasad (author) / Chen, Chingchi (author)


    Publication date :

    2021-03-01


    Size :

    4559403 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English



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