In this presentation we will provide basic radiation effects on electronics, information on radiation effects and sources, a review of domestic SEE facilities and other radiation test facilities.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)


    Contributors:
    K. A. Label (author)

    Publication date :

    2017


    Size :

    35 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English






    Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | NTRS | 2012


    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | NTRS | 2010


    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    M. V. O'Bryan / K. A. LaBel / J. A. Pellish et al. | NTIS | 2010