Through the use of a modification of the TRL (Through-Reflect-Line) method, integrated circuits contained within transitions have been successfully de-embedded. Two waveguide-to-suspended-substrate fixtures of different lengths were fabricated on a computer-controlled mill. Printed circuit waveguide probes were intentionally shortended to make them very reactive. Transmission and reflection measurement of a filter placed between the probes highlight the differences between measured and de-embedded results. This report reviews the theory behind TRL, explains the modifications used, and presents a computer program to de-embedded measurements from a Wiltron 360 network analyzer.


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    Title :

    De-Embedding Millimeter-Wave Integrated Circuits with TRL


    Contributors:
    D. Rubin (author)

    Publication date :

    1991


    Size :

    31 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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