Reduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Specimen Holder for Analytical Electron Microscopes


    Contributors:

    Published in:

    Publication date :

    1985-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


    Specimen Holder For Flammability Tests

    Rucker, Michelle A. | NTRS | 1992



    Mode-II-Fracture Specimen And Holder

    Buzzard, Robert J. / Ghosn, Louis / Succop, George | NTRS | 1991


    Microchemistry and the New Scanning Electron Microscopes

    Kasdan, M. J. / Kennedy, S. K. | British Library Conference Proceedings | 1999


    Specimen and Holder for Sliding-Mode Fatigue Tests

    Buzzard, R. J. / Succop, G. / Gross, B. | NTRS | 1987