Document summarizes 15 studies of single-event upsets covering 60 different types of semiconductor devices. Studies discussed in document include verification of basic reactions induced by heavy ions and protons and surveys of latchup and bit-flip susceptibility of several types of devices and device-fabrication technologies.


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    Title :

    Single-Event-Upset Studies: A Compilation


    Contributors:

    Published in:

    Publication date :

    1986-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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