Heavy secondary ions do not significantly alter device responses. Conclusion that external reaction products cause no significant alteration of single-event-upset response based on comparison of data obtained from both lidded and unlidded devices and for proton beams impinging at angles ranging from 0 degrees to 180 degrees with respect to chip face. Study also found single-event-upset cross section increases only modestly as proton energy increased to 590 MeV, characteristic of maximum energies expected in belts of trapped protons surrounding Earth and Jupiter.
Single-Event Upsets Caused by High-Energy Protons
NASA Tech Briefs ; 10 , 1
1986-06-01
Miscellaneous
No indication
English
AIAA | 1983
|System effects of single event upsets
AIAA | 1989
|Estimating Rates Of Single-Event Upsets
NTRS | 1988
|Anomalies due to Single Event Upsets
Online Contents | 1994
|Anomalies due to single event upsets
AIAA | 1990
|