Testing fixture facilitates radio-frequency characterization of microwave and millimeter-wave integrated circuits. Includes base onto which two cosine-tapered ridge waveguide-to-microstrip transitions fastened. Length and profile of taper determined analytically to provide maximum bandwidth and minimum insertion loss. Each cosine taper provides transformation from high impedance of waveguide to characteristic impedance of microstrip. Used in conjunction with automatic network analyzer to provide user with deembedded scattering parameters of device under test. Operates from 26.5 to 40.0 GHz, but operation extends to much higher frequencies.


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    Title :

    Testing Fixture For Microwave Integrated Circuits


    Contributors:

    Published in:

    Publication date :

    1989-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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