Report provides nearly comprehensive body of data on single-event upsets due to irradiation by heavy ions. Combines new test data and previously published data from governmental and industrial laboratories. Clear trends emerge from data useful in predicting future performances of devices.


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    Title :

    Trends In Susceptibility To Single-Event Upset



    Published in:

    Publication date :

    1989-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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