Proposed single-exposure technique for producing long-equivalent-wavelength interferograms (LEWI's) involves use of photographic film to record two-wavelength interferogram nonlinearly in single exposure. Nonlinearity required to produce difference-spatial-frequency Fourier component containing LEWI information obtained by adjusting exposure so it falls on nonlinear portion of sensitivity curve of film. After two-wavelength interferogram recorded, film developed in conventional manner. Possible to use LEWI's to measure surface contours of such objects as human corneas, not expected to remain stationary for two exposures. Commercial interferogram-processing computer programs used to convert LEWI's into topographical representations of surfaces.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Single-Exposure Long-Equivalent-Wavelength Interferometry


    Contributors:

    Published in:

    Publication date :

    1991-11-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Wavelength references for optical interferometry

    Fox, R.W. / Hollberg, L. | IEEE | 2005




    An equivalent circuit model for the long-wavelength quantum well infrared photodetectors

    Li, L. / Xiong, D. Y. / Wen, J. et al. | British Library Online Contents | 2013


    Biphoton Interferometry to Observe Photonic de Broglie Wavelength

    Shimizu, R. / Edamatsu, K. / Ito, T. et al. | British Library Conference Proceedings | 2001