A novel EUV spectrometer is presented for the ORFEUS-SPAS mission. It uses a set of four varied line-space spherical diffraction gratings to obtain high-resolution spectra of point sources at wavelengths between 390 and 1200 A. The spectra are recorded with two detector units, each containing curved-surface microchannel plates and a delay-line anode-readout system. An independent optical system detects the image of the source in the entrance aperture and tracks the source as it drifts during an observation, enabling a reconstruction of the spectra postflight. The overall system performance is discussed and illustrated by synthetic spectra.


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    Title :

    The Berkeley EUV spectrometer for ORFEUS


    Contributors:
    Hurwitz, M. (author) / Bowyer, S. (author)

    Published in:

    Publication date :

    1991-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


    The Berkeley EUV spectrometer for ORFEUS

    Hurwitz, M. / Bowyer, S. | Elsevier | 1991


    ORFEUS

    Grewing, M. / Appenzeller, I. / Barnstedt, J. et al. | British Library Online Contents | 1998




    ORFEUS - scientific targets and optical performance

    Graue, R. | British Library Online Contents | 1992