The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.


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    Title :

    The Measurement of the Directional Hemispherical Reflectance From Spectralon


    Contributors:

    Publication date :

    1997-09-01


    Type of media :

    Preprint


    Type of material :

    No indication


    Language :

    English




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