The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.
The Measurement of the Directional Hemispherical Reflectance From Spectralon
1997-09-01
Preprint
No indication
English
Hemispherical emissivity by infrared reflectance
British Library Conference Proceedings | 2005
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