Enhanced damage at low does rated in linear integrated circuits
The NASA Electronic Parts and Packaging (NEPP) '02 Workshop
2002-04-30
Conference paper
No indication
English
Online Contents | 2000
Online Contents | 2000
British Library Conference Proceedings | 1997
|Radiation Damage in MOS Integrated Circuits, Part 1
NTIS | 1971
|SAE Technical Papers | 2002