This is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).


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    Title :

    Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data


    Contributors:
    Berg, Melanie (author) / Kim, Hak (author) / Phan, Anthony (author) / Seidleck, Christina (author) / LaBel, Ken (author)

    Conference:

    Annual Single Event Effects (SEE) Symposium ; 2016 ; San Diego, CA, United States
    Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2016 ; San Diego, CA, United States


    Publication date :

    2016-06-26


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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