We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Title :

    Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program



    Conference:

    2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017) ; 2017 ; New Orleans, LA, United States


    Publication date :

    2017-07-17


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English





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