The purpose of this testing was to characterize the pulsed-laser-induced single event effect (SEE) susceptibility of the Texas Instruments LM7171 voltage feedback amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.


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    Title :

    Texas Instruments LM7171 Voltage Feedback Amplifier Laser Single-Event Effects Characterization Test Report


    Contributors:

    Publication date :

    2018-07-27


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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