No abstract provided


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Characterisation of Silicon Lattice Defects using CCDs


    Contributors:

    Publication date :

    2021-03-04


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English



    High accuracy sun sensor using CCDs

    NINOMIYA, KEIKEN / OGAWARA, YOSHIAKI / TSUNO, KATSUHIKO et al. | AIAA | 1988


    CCDs point the way

    King, D. | Tema Archive | 1988


    Gamma noise in CCDs

    Autio, G.W. / Bafito, M.A. | Tema Archive | 1975


    Development of X-Ray CCDs

    Burt, D. J. | British Library Online Contents | 1992


    Electron multiplying CCDs [4877-07]

    Denvir, D. J. / Conroy, E. | British Library Conference Proceedings | 2003